CAES Lab Equipment
The combined equipment infrastructure of the CAES consortium provides access to high-tech, state-of-the-art tools for researchers, academia and industries.
Equipment List
| Asset | Mfr and Model | Focus Area | Application | Lab Name | Lab Link |
|---|---|---|---|---|---|
| Scanning Transmission Electron Microscope (STEM) | ThermoFisher Spectra 300 - monochromated, double-corrected, 30 - 300kV, with Super-X EDS, Ultra-fast DualEELS, EMPAD, ASTAR, etc; Application: Images materials structurally and chemically down to sub-angstrom scale | Materials characterization | Images materials structurally and chemically down to atomic scale | Microscopy and Characterization Suite | Lab Info |
| Scanning Transmission Electron Microscope (STEM) | FEI Tecnai TF30-FEG STwin TEM with EDS, EELS (GIF), EFTEM & TopSpin | Materials characterization | Images materials structurally and chemically down to atomic scale | Microscopy and Characterization Suite | Lab Info |
| Local Electrode Atom Probe (LEAP) | Cameca LEAP 4000X HR | Materials characterization | Creates atom-by-atom maps and images 3-D construction of up to hundreds of millions of atoms; provides accurate chemical information and statistical analysis. | Microscopy and Characterization Suite | Lab Info |
| Scanning Electron Microscope (SEM) | JEOL JSM 6610LV with EDS, EBSD, & CL | Materials characterization | Images material surfaces from micrometer to nanometer scale | Microscopy and Characterization Suite | Lab Info |
| NanoIndenter/Atomic Force Microscope/Magnetic Force Microscope | Hysitron TI950 TriboIndenter | Materials characterization | Nano-mechanical test instrument for measuring the hardness and elastic modulus of materials, and imaging surface morphology down to atomic scale. Capable of performing Magnetic Force Microscopy | Microscopy and Characterization Suite | Lab Info |
| X-Ray Diffractometer (XRD) | Rigaku SmartLab | Materials characterization | Phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. | Microscopy and Characterization Suite | Lab Info |
| Nanomill | Fishione 1040 | Materials characterization | Remove FIBing damages to TEM lamellas and LEAP tips. | Microscopy and Characterization Suite | Lab Info |
| Ion Mill, Precision Ion Polishing System (PIPS) | Gatan PIPS II | Materials characterization | TEM sample preparation. | Microscopy and Characterization Suite | Lab Info |
| Electrolyte Polisher | Fishione | Materials characterization | TEM sample preparation. | Microscopy and Characterization Suite | Lab Info |
| Spark Plasma Sintering System (SPS) | Fuji Dr. Sinter | Materials characterization | Isostatic sintering of metallic or ceramic powders at very high (2000C) temperatures. | Advanced Materials and Characterization Labortory | Lab Info |
| Hi Temperature Furnace (2000 C) | Thermal Technology 1000-4560-FP20 | Materials characterization | Sample preparation, alloying of materials | Advanced Materials and Characterization Labortory | Lab Info |
| Automated Micro Indentation Hardness Tester | LECO LM247AT | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Non-Rad Glovebox | Custom | Materials characterization | Sample preparation of rad material | Advanced Materials and Characterization Labortory | Lab Info |
| Rad Glovebox | Custom | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Linear Sectioning Machine, Non-Rad | Leco MSX-205MZ | Materials characterization | Sample prep | Advanced Materials and Characterization Labortory | Lab Info |
| Polisher / Grinder, Rad | Beuhler Minimet 1000 | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Polisher, Non-Rad | LECO Model: GPX-200 | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Powder Press, 25 Ton | Carver AutoPellet Press (2) Inside Glovebox | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Grinder/Polisher, Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Grinder/Polisher, Non-Rad | LECO SS-1000 Spectrum | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Hand Grinder | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Instron Shear Punch or Tensile Test | Mechanical Testing | Mechanical Properties | Advanced Materials and Characterization Labortory | Lab Info | |
| Saw, Rad | Buehler Isomet Low Speed Saw | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Mechanical Test Frame | Instron | Mechanical Testing | Mechanical Properties | Advanced Materials and Characterization Labortory | Lab Info |
| Vacuum Tube Furnace | CM Model 1730-12 HT | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Nano Indenter Atomic Force Microscope (AFM) | Hysitron TI-950 TriboIndenter | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Micro-hardness Tester | LECO AMH-Series | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Retsch Mill | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info | |
| Sample Mounting Press | LECO DS-20 | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Vibratory Polisher | Buehler VibroMet 2 | Materials characterization | Sample preparation | Advanced Materials and Characterization Labortory | Lab Info |
| Computer Assisted Virtual Environment (CAVE) | Digital Visualization | Digital Visualization | Applied Visualization Laboratory | Lab Info | |
| IQ-Stations | Digital Visualization | Digital Visualization | Applied Visualization Laboratory | Lab Info | |
| Virtual Reality Headsets | Digital Visualization | Digital Visualization | Applied Visualization Laboratory | Lab Info | |
| Stereo Wall | Digital Visualization | Digital Visualization | Applied Visualization Laboratory | Lab Info | |
| Mobile Devices | Digital Visualization | Digital Visualization | Applied Visualization Laboratory | Lab Info | |
| Gas Flow Proportional Counter | PROTEAN WPC-9550 | Catalysis & Transient Kinetics | Sample Counters: A low-level alpha/beta counter used to assess environmental swipes/filters for radioactivity. | Innovation Laboratory | Lab Info |
| Tri-Carb Liquid Scintillation Counter | Perkin-Elmer | Catalysis & Transient Kinetics | Sample Counters: A low-level alpha/beta/gamma counter used to assess environmental swipes/liquid samples for radioactivity. | Innovation Laboratory | Lab Info |
| Alpha Spectrometer | ORTEC | Catalysis & Transient Kinetics | Sample Counters: Instrument used to qualify and quantify alpha-emitting radionuclides present in a sample. | Innovation Laboratory | Lab Info |
| High Purity Germanium (HPGe) Gamma Spectrometers | ORTEC | Catalysis & Transient Kinetics | Sample Counters: Instrument used to qualify and quantify gamma-emitting radionuclides present in a sample. | Innovation Laboratory | Lab Info |
| Standard High-Resolution Gamma Spectrometer | ORTEC | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| High-Efficiency Gamma Spectrometer | ORTEC | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Standard High-Resolution Gamma Spectrometer | ORTEC | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| GM Detectors | Model-3 Alpha and Beta | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Ionization Chambers | 9DP, Fluke | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Scintillation Detectors: GSM-500, GSM-501, Model-19, NaI detectors | GSM-500, GSM-501, Model-19, NaI detectors | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Continuous Air Monitor: iCAM | iCAM | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Neutron Detection: PUG-7N | PUG-7N | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
| Isotope Identifier: ICS-4000 | ICS-4000 | Catalysis & Transient Kinetics | Sample Counters Portable Contamination Detectors | Innovation Laboratory | Lab Info |
